Eucryptite and Quartz reflectance spectrum, IR illum., CSIRO 2025
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Measurement details
| Description | Reflectance spectrum of Eucryptite in PSP_E, from CSIRO Reflectance (2025). From original file 'Eucryptite_PSP_E_Batch_3_a_.0.dpt'. |
| Reference | Reflectance spectra measured by Carsten Laukamp and colleagues |
| Materials | Eucryptite [ LiAlSiO4 ], Quartz [ SiO2 ] |
| Analysis technique | Reflectance |
| Instrument | Bruker Vertex 80v FTIR spectrometer |
| Illumination | IR light source |
| Channel count | 3667 |
| Wavelength range | 2004 … 16664 nm |
| Intensity range | 0.277 absolute reflectance |
| Line | H2O Stretch: 2800 — 3660 cm-1 |
| Download | Eucryptite_PSP_E_Batch_3_a_.0.txt [80.0 kB] |
Specimen details
| Name | PSP_E Eucryptite |
| Owner | CSIRO - ARRC Collection |
| Link to CMR Specify database | https://cmr-specify.csiro.au/specify/bycatalog/CMR-MS/2024-MS-0000000335 |
| Phase abundance (QXRD) |
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| Other measurements | Ankerite, Clinochlore, Cookeite, Eucryptite, Kaolinite, Muscovite-1M, Pollucite and Quartz XRD quant/phase, x-ray beam, Owen et al. 2023 (Jobs # 6243, 6245) |
Specimen image
Image of Eucryptite, Cookeite, Kaolinite (var. poorly crystalline), Pollucite and Quartz in specimen 'PSP_E Eucryptite' [CSIRO].
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