Topaz reflectance spectrum, IR illum., CSIRO 2025
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Measurement details
| Description | Reflectance spectrum of Topaz in M2532, from CSIRO Reflectance (2025). From original file 'Topaz_M2532_Batch_3_.0.dpt'. |
| Reference | Reflectance spectra measured by Carsten Laukamp and colleagues |
| Material | Topaz [ Al2SiO4F2 ] |
| Analysis technique | Reflectance |
| Instrument | Bruker Vertex 80v FTIR spectrometer |
| Illumination | IR light source |
| Channel count | 3667 |
| Wavelength range | 2004 … 16664 nm |
| Intensity range | 0.589 absolute reflectance |
| Download | Topaz_M2532_Batch_3_.0.txt [80.0 kB] |
Specimen details
| Name | M2532 Topaz |
| Owner | CSIRO - ARRC Collection |
| Phase abundance (QXRD) | |
| Other measurements | Quartz and Topaz XRD quant/phase, x-ray beam, Owen et al. 2023 (Jobs # 6243, 6245) |
Specimen image
Image of Topaz and Quartz in specimen 'M2532 Topaz' [CSIRO].
(C) 2026 CSIRO Mineral Resources. All rights reserved.
Composition
| Element | Atoms | At% | Wt% |
|---|---|---|---|
| Al | 2 | 22.2 | 29.3 |
| Si | 1 | 11.1 | 15.3 |
| O | 4 | 44.4 | 34.8 |
| F | 2 | 22.2 | 20.6 |
| Total | 9 | 100 | 100 |