Benitoite PL/UV measurement, 254 nm Xe lamp illum., Takahashi et al. 2008
Measurement details
| Reference | Takahashi et al. 2008 TAKAHASHI Y., KITAMURA K., IYI N., INOUE S. & FUJIWARA T. (2008). Journal of the Ceramic Society of Japan, 116(1358), 1143-1146. DOI: https://doi.org/10.2109/jcersj2.116.1143 |
| Materials | Benitoite (var. Ge doped) [ BaTiSi3O9:Ge ], Benitoite [ BaTiSi3O9 ] |
| Specimen temperature | Ambient |
| Analysis technique | Ultraviolet photoluminescence |
| Instrument | Shimadzu RD-220F spectrofluorometer |
| Probe | Xe lamp light source |
| Peak wavelength | 254 nm |
| Lines | TiO6: 450 nm, 430 nm |