Tantalum SXES spectrum, 5 keV e- beam, CSIRO 2016
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Measurement details
| Description | SXES spectrum of Tantalum |
| Reference | CSIRO SXES database by C. M. MacRae, N. C. Wilson, and A. Torpy, CSIRO Mineral Resources https://spectroscopy.csiro.au/sxes |
| Date measured | 2016-09-28 |
| Material | Tantalum [ Ta ] |
| Analysis technique | Soft x-ray emission spectroscopy (SXES) |
| Instrument | JEOL 8530F |
| Probe | 5 keV electron beam |
| Beam current | 59.8 nA |
| Grating | 50XL |
| Acquisition time | 640 s |
| Channel count | 2048 |
| Energy range | 46.8109 … 170.472 eV |
| Intensity range | 40.3 … 1040 counts |
| Integral | 594373 counts |
Specimen details
| Name | Ta METM-33 |
| Owner | CSIRO |
| Other measurements | Tantalum SXES spectrum, 5 keV e- beam, CSIRO 2016 |
Specimen image
BSE image of Tantalum [Ta] in 'Ta METM-33' standard (CSIRO). Instrument: JEOL JXA-8530F. Date: July 2025.
(C) 2025 CSIRO Mineral Resources. All rights reserved.
Measurement image
SXES spectrum of Tantalum
(C) 2016 CSIRO Mineral Resources